Title :
The reflectance and electrical properties of nanocrystalline metal Tm
Author :
Fengyan, Liu ; Bihui, Hou ; Ming, Yue ; Jincheng, Hao
Author_Institution :
Coll. of Appl. Sci., Beijing Univ. of Technol., Beijing, China
Abstract :
The reflectance spectra R(λ) within 200nm-2500nm wavelength range of the two nanocrystalline bulk metal thulium(Tm) samples were studied. The reflectivities R(λ) of Sample 1 and Sample 2 reach their minima 2.383% at 256nm and 3.439% at 214nm respectively. These minima correspond to the plasma oscillations in nanocrystalline bulk metal Tm.
Keywords :
electric properties; nanostructured materials; plasma oscillations; reflectivity; semimetals; thulium; Tm; electrical properties; minima; nanocrystalline bulk metal thulium samples; plasma oscillations; reflectance spectra; wavelength 200 nm to 2500 nm; Conductivity; Crystals; Metals; Oscillators; Plasmas; Reflectivity;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612548
