Title :
Conductiveadhesives containing Ag-Sn alloys as conductive filler
Author :
Suzuki, Kenichi ; Shirai, Yukio ; Mizumura, Noritsuka ; Komagata, Michinon
Keywords :
Adhesives; Contact resistance; Copper; Electrical resistance measurement; Integrated circuit interconnections; Resistors; Semiconductor device measurement; Silver; Testing; Tin;
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2004. POLYTRONIC 2004. 4th IEEE International Conference on
Print_ISBN :
0-7803-8744-9
DOI :
10.1109/POLYTR.2004.1402739