• DocumentCode
    2713086
  • Title

    SAT-Based Automatic Rectification and Debugging of Combinational Circuits with LUT Insertions

  • Author

    Jo, Satoshi ; Matsumoto, Takeshi ; Fujita, Masahiro

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2012
  • fDate
    19-22 Nov. 2012
  • Firstpage
    19
  • Lastpage
    24
  • Abstract
    Introducing partial programmability in circuits by replacing some gates with look up tables (LUTs) can be an effective way to improve post-silicon or in-field rectification and debugging. Although finding configurations of LUTs that can correct the circuits can be formulated as a QBF problem, solving it by state-of-the-art QBF solvers is still a hard problem for large circuits and many LUTs. In this paper, we present a rectification and debugging method for combinational circuits with LUTs by repeatedly applying Boolean SAT solvers. Through the experimental results, we show our proposed method can quickly find LUT configurations for large circuits with many LUTs, which cannot be solved by a QBF solver.
  • Keywords
    combinational circuits; program debugging; table lookup; Boolean SAT solver; LUT insertion; QBF solver; SAT based automatic rectification; combinational circuit; debugging method; in-field rectification; look up tables; partial programmability; Circuit faults; Combinational circuits; Debugging; Field programmable gate arrays; Logic functions; Logic gates; Table lookup; debugging; look-up table; rectification; satisfiability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2012 IEEE 21st Asian
  • Conference_Location
    Niigata
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4673-4555-2
  • Electronic_ISBN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2012.55
  • Filename
    6394165