DocumentCode
2713086
Title
SAT-Based Automatic Rectification and Debugging of Combinational Circuits with LUT Insertions
Author
Jo, Satoshi ; Matsumoto, Takeshi ; Fujita, Masahiro
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Tokyo, Tokyo, Japan
fYear
2012
fDate
19-22 Nov. 2012
Firstpage
19
Lastpage
24
Abstract
Introducing partial programmability in circuits by replacing some gates with look up tables (LUTs) can be an effective way to improve post-silicon or in-field rectification and debugging. Although finding configurations of LUTs that can correct the circuits can be formulated as a QBF problem, solving it by state-of-the-art QBF solvers is still a hard problem for large circuits and many LUTs. In this paper, we present a rectification and debugging method for combinational circuits with LUTs by repeatedly applying Boolean SAT solvers. Through the experimental results, we show our proposed method can quickly find LUT configurations for large circuits with many LUTs, which cannot be solved by a QBF solver.
Keywords
combinational circuits; program debugging; table lookup; Boolean SAT solver; LUT insertion; QBF solver; SAT based automatic rectification; combinational circuit; debugging method; in-field rectification; look up tables; partial programmability; Circuit faults; Combinational circuits; Debugging; Field programmable gate arrays; Logic functions; Logic gates; Table lookup; debugging; look-up table; rectification; satisfiability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location
Niigata
ISSN
1081-7735
Print_ISBN
978-1-4673-4555-2
Electronic_ISBN
1081-7735
Type
conf
DOI
10.1109/ATS.2012.55
Filename
6394165
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