Development of an embedded terminal protection device (TPD) tester

Author

Hoeft, Lothar O. ; Salas, Thomas M. ; Prather, William D.

Author_Institution

BDM Federal Inc., Albuquerque, NM, USA

fYear

1996

fDate

19-23 Aug 1996

Firstpage

392

Lastpage

395

Abstract

A test technique has been developed that can measure the clamp voltage of embedded terminal protection devices and thus determine their functionality with the application of a single pulse. The use of a moderate (50 ns) risetime reduces the artifact associated with the circuit elements and parasitic reactances. Pulse durations of several hundred nanoseconds are adequate for measuring the clamp voltage of TPDs in a wide range of circuits. With the appropriate choice of pulse duration and amplitude, the technique can be used in automatic test systems

Keywords

aircraft maintenance; aircraft testing; automatic test equipment; electromagnetic compatibility; electronic equipment testing; protection; voltage measurement; 50 ns; aircraft; automatic test systems; circuit elements; circuits; clamp voltage; electromagnetic hardness surveillance; embedded terminal protection device tester; line replaceable units; maintenance; moderate risetime; parasitic reactances; pulse durations; single pulse; Aircraft; Automatic testing; Circuit testing; Clamps; Electromagnetic measurements; Protection; Pulse circuits; Pulse measurements; Voltage measurement; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on

Conference_Location

Santa Clara, CA

Print_ISBN

0-7803-3207-5

Type

conf

DOI

10.1109/ISEMC.1996.561265

Filename

561265