Title :
Near-infrared spectroscopy for non-destructive coating analysis calibrated by Terahertz Pulsed Imaging
Author :
Zhong, Shuncong ; Shen, Yaochun ; Shen, Hao ; Evans, Mike J. ; May, Robert K. ; Zeitler, J. Axel ; Warr, Ian
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
Abstract :
Near-infrared (NIR) spectroscopy is a versatile technique for non-destructive analysis of pharmaceutical tablet coating thickness; however, it needs a calibration model and thus the prior knowledge about the coating thickness of each tablet is required. In this work, we demonstrate that Terahertz Pulsed Imaging (TPI) can provide, in a nondestructive fashion, such coating thickness information for building the calibration model needed by the NIR technique.
Keywords :
calibration; coating techniques; infrared spectroscopy; terahertz wave imaging; thickness measurement; NIR spectroscopy; TPI; calibration model; near infrared spectroscopy; nondestructive coating analysis; pharmaceutical tablet coating thickness; terahertz pulsed imaging; Biological neural networks; Calibration; Coatings; Imaging; Pharmaceuticals; Spectroscopy; Thickness measurement;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612668
