Title :
Optimum shape design of matching stubs based on full-wave analysis
Author :
Lee, Hong-bae ; Koh, Dongsoo ; Itoh, Tatsuo ; Villegas, Frank J. ; Hung, H.A.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
The shapes of matching stubs are designed with an optimizer based on full-wave analysis. By selecting the shape of matching stub as the design parameter, compact circuits for matching could be obtained. FEM is used as a full-wave analyzer, and adjoint variable method is adopted for sensitivity analysis
Keywords :
finite element analysis; impedance matching; integrated circuit interconnections; microwave integrated circuits; sensitivity analysis; FEM; adjoint variable method; design parameter; full-wave analysis; matching stubs; optimum shape design; sensitivity analysis; Design optimization; Frequency; Integrated circuit interconnections; Joining processes; MMICs; Microwave integrated circuits; Optimization methods; Sensitivity analysis; Shape measurement; Transmission line matrix methods;
Conference_Titel :
Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific
Print_ISBN :
962-442-117-X
DOI :
10.1109/APMC.1997.656394
