DocumentCode :
2716526
Title :
Multi-feature metric learning with knowledge transfer among semantics and social tagging
Author :
Wang, Shuhui ; Jiang, Shuqiang ; Huang, Qingming ; Tian, Qi
Author_Institution :
Key Lab. of Intell. Inf. Process, Inst. of Comput. Tech., Beijing, China
fYear :
2012
fDate :
16-21 June 2012
Firstpage :
2240
Lastpage :
2247
Abstract :
Previous metric learning approaches learn a unified metric for all the classes on single feature representation, thus cannot be directly transplanted to applications involving multiple features, hundreds to thousands of hierarchical structured semantics and abundant social tagging. In this paper, we propose a novel multi-task multi-feature metric learning method which models the information sharing mechanism among different learning tasks. We decompose the real world multi-class problems such as semantic categorization or automatic tagging into a set of tasks where each task corresponds to several classes with strong visual correlation. We conduct metric learning to learn a set of (hyper)category-specific metrics for all the tasks. By encouraging model sharing among tasks, more generalization power is acquired. Another advantage is the capability of simultaneous learning with semantic information and social tagging based on the multi-task learning framework, and thus they both benefit from the information provided by each other. Experiments demonstrate the advantages on applications including semantic categorization and automatic tagging compared with other popular metric learning approaches.
Keywords :
computer vision; learning (artificial intelligence); automatic tagging; category-specific metrics; feature representation; hierarchical structured semantics; information sharing mechanism; knowledge transfer; multifeature metric learning; multitask metric learning; semantic categorization; semantic information; social tagging; visual correlation; Kernel; Measurement; Semantics; Support vector machines; Tagging; Training; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
ISSN :
1063-6919
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2012.6247933
Filename :
6247933
Link To Document :
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