Title :
A Compact 600 GHz Electronically Tunable Vector Measurement System for Submillimeter Wave Imaging
Author :
Dengler, Robert J. ; Maiwald, Frank ; Siegel, Peter H.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
A compact submillimeter wave transmission/reflection measurement system has been demonstrated at 560-635 GHz, with electronic tuning over the entire band. Maximum dynamic range measured at a single frequency is 90 dB (60 dB typical), and phase noise is less than +/- 2deg. By using a frequency steerable lens at the source output and mixer input, the frequency agility of the system can be used to scan the source and receive beams, resulting in near real-time imaging capability using only a single pixel
Keywords :
electromagnetic wave reflection; electromagnetic wave transmission; lenses; network analysers; phase measurement; submillimetre wave imaging; submillimetre wave measurement; 560 to 635 GHz; electronic tuning; electronically tunable vector measurement; frequency agility; frequency steerable lens; phase measurement; real-time imaging; submillimeter wave imaging; submillimeter wave reflection measurement; submillimeter wave transmission measurement; Acoustic reflection; Dynamic range; Frequency measurement; Noise measurement; Optical reflection; Phase measurement; Submillimeter wave devices; Submillimeter wave measurements; Submillimeter wave propagation; Tuning; Submillimeter wave imaging; Submillimeter wave mixers; phase measurement;
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2006.249792
