Title :
A novel approach to fabricating high Qm PZT
Author :
Chediak, J.A. ; Pilgrim, S.M.
Author_Institution :
Coll. of Ceramics, Alfred Univ., NY, USA
Abstract :
SAW devices are being investigated for TV-IF filters and mobile telephone applications. Additions of MnO2 to PZT can result in materials with zero temperature coefficients and low propagation losses. The available Qm´s of PZT materials however, can limit their usefulness in energy-critical applications. In this work, a novel approach to improving the performance of PZT was attempted. The effect of both a dopant atom (Mn) and electron dopant pyrochlore phase, Sr2Sb2O7, were examined. MnO2 was added at 0.1, 0.3, and 0.5 wt% levels while the pyrochlore was added at the 5 mol% level. It was postulated that the pyrochlore phase might limit grain growth and reduce domain motion, thus increasing Qm. It was further postulated that compositions with both the pyrochlore and Mn doping should yield even greater Qm values. Properties of interest, kp, Qm, e, and loss, were measured by the resonance method. In summary, Mn doping was effective in improving properties. Pyrochlore additions did reduce grain size; however, the properties were degraded
Keywords :
acoustic materials; dielectric losses; dielectric resonance; electric domains; grain growth; grain size; lead compounds; manganese compounds; materials preparation; permittivity; piezoceramics; piezoelectric devices; strontium compounds; surface acoustic wave devices; MnO2 additions; PZT-MnO2-Sr2Sb2O7; PbZrO3TiO3-MnO2-Sr2Sb2O7; SAW devices; Sr2Sb2O7; TV-IF filters; domain motion; dopant atom; electron dopant pyrochlore phase; energy-critical applications; fabrication; grain growth; grain size; high Qm PZT; loss; low propagation losses; mobile telephone applications; performance; resonance method; zero temperature coefficients; Doping; Electrons; Filters; Loss measurement; Propagation losses; Q measurement; Strontium; Surface acoustic wave devices; Telephony; Temperature;
Conference_Titel :
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location :
East Brunswick, NJ
Print_ISBN :
0-7803-3355-1
DOI :
10.1109/ISAF.1996.598150