Title :
Invited paper: Design criteria for dependable System-on-Chip architectures
Author :
Hollstein, Thomas ; Samman, Faizal A. ; Jaiswal, Ashok ; Ying, Haoyuan ; Glesner, Manfred ; Hofmann, Klaus
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
Abstract :
The rapid improvement of semiconductor technologies is the enabling factor for the design of large-scale System-on-Chip (SoC) architectures. At the same time the scale-down of feature sizes in silicon technologies brings up new challenges as parameter variations of the transistor devices, an increased vulnerability for wear-out effects during the lifetime of the device and increased sensitivity for soft-errors. The overall system reliability is therefore an important topic to be addressed in the SoC design process as well as economic considerations related to manufacturing yield and lifetime maintainability. The aim of this contribution is to outline implications for the design process and to illustrate the dependability aspects at the example of SoC communication architectures being implemented as Networks-on-Chip (NoCs).
Keywords :
network-on-chip; semiconductor device reliability; semiconductor technology; NoC; SoC architectures; dependable system-on-chip architectures; lifetime maintainability; networks-on-chip; semiconductor technology; soft-errors; transistor devices;
Conference_Titel :
Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2011 6th International Workshop on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4577-0640-0
DOI :
10.1109/ReCoSoC.2011.5981518