DocumentCode :
2718775
Title :
On Rejecting Outliers by Smirnov Test for Massive Data Input System in Vegetable Geographical Origin Identification System
Author :
Sato, Nobuyoshi ; Uehara, Minoru ; Shimomura, Koichiro ; Yamamoto, Hirobumi ; Kamijo, Kenichi
Author_Institution :
Plant Regul. Res. Center, Toyo Univ., Itakura
fYear :
2007
fDate :
21-23 May 2007
Firstpage :
340
Lastpage :
347
Abstract :
As co-work with agricultural chemists, we developed a vegetable geographical origin identification system using trace element composition to solve cultivated place forging problems on vegetables in Japan. Vegetables cultivated in farm fields absorb trace metal elements from soil. Here, trace element means that very small quantity elements in chemistry. Since trace element compositions in soil differ from districts, trace element composition of cultivated vegetables also differs from districts, even farms. Our system can identify geographical origin of vegetables in short time by comparing trace element composition of doubtful vegetable and genuine vegetables. Therefore, trace element compositions of vegetables must be measured when they are shipped from farms. Normally, since fresh vegetables are sold in the same day of shipping, trace element compositions must be measured and recorded into databases in few hours, before they will arrive at market, sold to general consumers. In this paper, we describe a massive data gather system for our system which rejects outliers. In addition, we describe an interface between our system and measurement instruments that are PC/WS based but closed system.
Keywords :
agricultural products; farming; geographic information systems; goods distribution; identification technology; Smirnov test; agricultural chemists; cultivated place forging problems; farm fields; massive data input system; trace element compositions; trace metal elements; vegetable cultivation; vegetable geographical origin identification system; Agricultural products; Chemical elements; Chemistry; Computer science; Databases; Delay; Instruments; RFID tags; Soil; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Information Networking and Applications, 2007. AINA '07. 21st International Conference on
Conference_Location :
Niagara Falls, ON
ISSN :
1550-445X
Print_ISBN :
0-7695-2846-5
Type :
conf
DOI :
10.1109/AINA.2007.99
Filename :
4220913
Link To Document :
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