DocumentCode :
2719886
Title :
Accurate optical constants of ZnTe measured by THz-TDS with their standard deviations
Author :
Tripathi, Saroj R. ; Aoki, Makoto ; Asahi, Toshiaki ; Hosako, Iwao ; Hiromoto, Norihisa
Author_Institution :
Grad. Sch. of Sci. & Technol., Shizuoka Univ., Shizuoka, Japan
fYear :
2010
fDate :
5-10 Sept. 2010
Firstpage :
1
Lastpage :
2
Abstract :
Accurate optical constants of the ZnTe are essential to optimize its performance as a terahertz emitter and detector. We measured the optical constants like complex refractive index of ZnTe crystal using transmission terahertz time domain spectroscopy (THz-TDS) from 0.2 to 3.5 THz at room temperature and their standard deviation is calculated to quantify the random errors. The uncertainty in sample thickness measurement, which is important to consider especially in transmission THz-TDS, is also incorporated to compute the resultant standard deviations in all optical constants. The percentage errors of real and imaginary parts of refractive index at 1 THz are 0.01 and 1.22 respectively.
Keywords :
II-VI semiconductors; refractive index; terahertz wave spectra; time resolved spectra; zinc compounds; THz-TDS; ZnTe; ZnTe crystal; complex refractive index; frequency 0.2 THz to 3.5 THz; optical constants; sample thickness measurement; temperature 293 K to 298 K; terahertz wave detector; terahertz wave emitter; transmission terahertz time domain spectroscopy; Absorption; Adaptive optics; Optical imaging; Optical refraction; Optical variables control; Refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
Type :
conf
DOI :
10.1109/ICIMW.2010.5613015
Filename :
5613015
Link To Document :
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