DocumentCode :
2720128
Title :
Surface micromachined accelerometers
Author :
Boser, Bernhard E. ; Howe, Roger T.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
1995
fDate :
1-4 May 1995
Firstpage :
337
Lastpage :
344
Abstract :
Surface micromachining has enabled the co-fabrication of thin-film micromechanical structures and CMOS or Bipolar/MOS integrated circuits. Using linear, single-axis accelerometers as a motivating example, this paper discusses the fundamental mechanical noise floor as well as the electronic noise floors for representative capacitive position-sensing interface circuits. Operation in vacuum lowers the Brownian noise of a polysilicon accelerometer to below 1 μg/√Hz. For improved sensor performance, the position of the microstructure should be controlled using electrostatic force-feedback. Both analog and digital closed-loop accelerometers are described and contrasted, with the latter using high-frequency voltage pulses to apply force quanta to the microstructure and achieve a very linear response
Keywords :
accelerometers; integrated circuit noise; integrated circuit technology; micromachining; microsensors; Brownian noise; CMOS integrated circuits; analog closed-loop accelerometers; bipolar/MOS integrated circuits; capacitive position-sensing interface circuits; co-fabrication; digital closed-loop accelerometers; electronic noise floor; electrostatic force-feedback; linear single-axis accelerometers; mechanical noise floor; polysilicon; sensors; surface micromachining; thin-film micromechanical structures; Accelerometers; Electrostatics; Force control; Integrated circuit noise; MOS integrated circuits; Mechanical sensors; Micromachining; Micromechanical devices; Microstructure; Thin film circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1995., Proceedings of the IEEE 1995
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-2584-2
Type :
conf
DOI :
10.1109/CICC.1995.518198
Filename :
518198
Link To Document :
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