DocumentCode :
2721257
Title :
Sufficient condition for local invertibility of spatio-temporal 4D B-spline deformations
Author :
Chun, Se Young ; Schretter, Colas ; Fessler, Jeffrey A.
Author_Institution :
Harvard Med. Sch., Massachusetts Gen. Hosp., Boston, MA, USA
fYear :
2010
fDate :
14-17 April 2010
Firstpage :
1221
Lastpage :
1224
Abstract :
Recent advances in medical imaging technologies have made 4D image sequences available in clinical routine. As a consequence, image registration techniques are evolving from alignment of pairs of static volumetric images to spatio-temporal registration of dynamic (4D) images. Since the elastic image registration problem is ill-posed, additional prior information or constraints are usually required to regularize the problem. This work proposes to enforce local invertibility (diffeomorphism) of 4D deformations. A novel sufficient condition for local invertibility over continuous space and time is proposed and a practical regularization prior is designed from the theory. The method has been applied to an image registration (motion tracking) of a dynamic 4D CT image sequence. Results show that using proposed regularizer leads to deformations that are more plausible for respiratory motion than the standard approach without additional temporal regularization.
Keywords :
computerised tomography; image motion analysis; image registration; image sequences; medical image processing; optimisation; diffeomorphism; dynamic 4D CT image sequence; elastic image registration problem; local invertibility; motion tracking; optimization; respiratory motion; spatio-temporal 4D B-spline deformations; static volumetric images; temporal regularization; Biomedical imaging; Computed tomography; Hospitals; Image registration; Image sequences; Inverse problems; Spatiotemporal phenomena; Spline; Sufficient conditions; Tracking; 4D deformation; diffeomorphism; image registration; local invertibility; sufficient condition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location :
Rotterdam
ISSN :
1945-7928
Print_ISBN :
978-1-4244-4125-9
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2010.5490215
Filename :
5490215
Link To Document :
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