DocumentCode :
2721776
Title :
Drop impact reliability of MEMS inertial sensors with membrane suspensions for mobile phones
Author :
Jong Woon Kim ; Heung Woo Park ; Min Kyu Choi ; Won Kyu Jeung ; Jung Won Lee
Author_Institution :
Corp. R&D Inst., AMD Lab., Samsung Electro-Mech., Suwon, South Korea
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
344
Lastpage :
349
Abstract :
MEMS accelerometers and gyroscopes enable new functions for portable electronics such as smartphones and tablet computers. Membrane suspensions are suitable for the inertial sensors using piezoelectric or piezoresistive effect, but they are susceptible to be damaged by drop impact. In this paper, system-level drop impact reliability was investigated for MEMS inertial sensors with membrane suspensions. Drop tests of the sensor modules mounted on mobile phone mockups were performed to observe effects of package parameters and impact orientation. After repeated drop tests, almost all membranes were broken while the failures could not be expected from component-level simulation. Therefore, a failure mechanism due to membrane buckling was suggested from system-level simulation and correlated with the drop test results. Based on the failure mechanism, new stopper design was applied and the drop impact failure was completely eliminated.
Keywords :
accelerometers; electronics packaging; failure analysis; gyroscopes; impact testing; microsensors; mobile handsets; notebook computers; reliability; MEMS accelerometers; MEMS gyroscopes; MEMS inertial sensors; drop impact reliability; failure mechanism; impact orientation; membrane buckling; membrane suspensions; mobile phones; package parameters; piezoelectric effect; piezoresistive effect; portable electronics; sensor modules; tablet computers; Acceleration; Micromechanical devices; Sensor phenomena and characterization; Sensor systems; Stress; Suspensions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6248853
Filename :
6248853
Link To Document :
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