• DocumentCode
    2722982
  • Title

    Why, IDDQ? [CMOS IC testing]

  • Author

    McEuen, Steven

  • Author_Institution
    Ford Microelectron. Inc., Colorado Springs, CO, USA
  • fYear
    1990
  • fDate
    10-14 Sep 1990
  • Firstpage
    252
  • Abstract
    Summary form only given. The author discusses the research conducted by Ford Microelectronics on the impact that IDDQ testing will have on the automotive IC industry. This research has been directed toward developing the tools to implement IDDQ testing, to identify failure locations, to understand what IDDQ identifies, to assess vendor quality levels, and to gauge the reliability impact. The increased sensitivity to processing problems that IDDQ testing provides makes it possible to detect infant mortality and early life failures before they become functionally bad. This has been substantiated through lower burn-in failures and life test studies
  • Keywords
    CMOS integrated circuits; automotive electronics; fault location; integrated circuit testing; quality control; reliability; CMOS IC; Ford Microelectronics; IDDQ testing; QC; automotive IC industry; failure locations; reliability; sensitivity; CMOS integrated circuits; CMOS technology; Integrated circuit testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.114024
  • Filename
    114024
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2722982