Title :
Identification of faulty processing elements by space-time compression of test responses
Author :
Karpovsky, M.G. ; Levitin, L.B. ; Vainstein, F.S.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Boston Univ., MA, USA
Abstract :
A novel approach to the identification of a faulty processing element, based on an analysis of the compressed response of the system, is proposed. The test response is compressed first in space and then in time, and a faulty processing element is identified by a hard-decision decoding of the corresponding space-time signature. The overhead analysis and the solution for the hardware minimization problem are presented for several important classes of systems. The proposed method results in considerable hardware savings
Keywords :
automatic testing; computer equipment testing; data compression; decoding; fault location; logic testing; faulty processing elements; hard-decision decoding; hardware minimization; overhead analysis; space-time compression; test response; Decoding; Design engineering; Educational institutions; Fault diagnosis; Hardware; Laboratories; System buses; System testing; Systems engineering and theory; Vectors;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114078
