Title :
A silicon-based, all-passive, 60 GHz, 4-element, phased-array beamformer featuring a differential, reflection-type phase shifter
Author :
Krishnaswamy, Harish ; Valdes-Garcia, Alberto ; Lai, Jie-Wei
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
This paper presents an all-passive, 4-element, phased-array beamformer based on a differential, reflection-type phase shifter (RTPS) operating in the 60GHz band. The RTPS consists of a differential, vertically-coupled, coupled-line hybrid and variable, parallel-LC, resonant, reflective loads, both of which enable low-loss millimeter-wave operation. The design considerations for a silicon-based implementation of all the beamformer elements are discussed in detail. In particular, the influence of the different RTPS components on its insertion loss is analyzed. The beamformer IC and a breakout of the RTPS are implemented using CMOS-only features of IBM´s 8HP 0.13 μm SiGe BiCMOS process, and employ areas of 2.1mm2 and 0.33mm2, respectively, without probe pads. Differential s-parameter measurements at 60GHz show a phase-shift range greater than 150°, insertion losses of 4-6.2dB in the RTPS and 14-16dB in the beamformer, and an isolation better than 35dB between adjacent beamformer channels. Measurements across temperature and process variations are also presented.
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; S-parameters; array signal processing; elemental semiconductors; field effect MIMIC; millimetre wave phase shifters; silicon; IBM 8HP BiCMOS process; Si; SiGe; beamformer channels; differential phase shifter; differential s-parameter measurements; frequency 60 GHz; loss 4 dB to 6.2 dB; low-loss millimeter-wave operation; phased array beamformer; reflection-type phase shifter; size 0.13 mum; Capacitance; Impedance; Insertion loss; Loss measurement; Metals; Transmission line measurements; Varactors;
Conference_Titel :
Phased Array Systems and Technology (ARRAY), 2010 IEEE International Symposium on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4244-5127-2
Electronic_ISBN :
978-1-4244-5128-9
DOI :
10.1109/ARRAY.2010.5613365