• DocumentCode
    2723980
  • Title

    A 5GHz 90-nm CMOS all digital phase-locked loop

  • Author

    Lu, Ping ; Sjöland, Henrik

  • Author_Institution
    Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
  • fYear
    2009
  • fDate
    16-18 Nov. 2009
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    An all digital phase-locked loop (ADPLL) has been implemented in a 90-nm CMOS process. It uses a phase frequency detector (PFD) connected to two time-to-digital converters (TDC). To save power the TDCs use uneven delay time in the delay line cells. An automatic tuning bank controller selects active bank of the digitally controlled oscillator (DCO), which features three separate tuning banks. The PLL achieves a phase noise of -125 dBc/Hz at 1 MHz offset from a divided-by-2 carrier frequency of 2.58 GHz. The core area is 0.33 mm2 and the current consumption is 30 mA from a 1.2 V supply.
  • Keywords
    CMOS integrated circuits; phase locked loops; phase noise; CMOS process; automatic tuning bank controller; current 30 mA; current consumption; delay line cells; digital phase-locked loop; digitally controlled oscillator; divided-by-2 carrier frequency; frequency 1 MHz to 5 GHz; phase frequency detector; phase noise; size 90 nm; time-to-digital converters; uneven delay time; voltage 1.2 V; Automatic control; CMOS process; Delay effects; Delay lines; Digital control; Oscillators; Phase frequency detector; Phase locked loops; Phase noise; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2009. A-SSCC 2009. IEEE Asian
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4433-5
  • Electronic_ISBN
    978-1-4244-4434-2
  • Type

    conf

  • DOI
    10.1109/ASSCC.2009.5357180
  • Filename
    5357180