• DocumentCode
    2724037
  • Title

    Novel clamp circuits for IC power supply protection

  • Author

    Maloney, Timothy J. ; Dabral, Sanjay

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • fYear
    1995
  • fDate
    12-14 Sept. 1995
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Biased and terminated p-n-p transistor chains are made from floating n-wells in p-substrate CMOS and used for power supply ESD clamps. The p-n-p gain may allow a compact termination circuit to be used, resulting in a stand-alone clamp. Bipolar p-n-p action accounts for unwanted low-voltage conduction as well as for very desirable clamping of power supply overvoltages. Bias networks are used to prevent excessive leakage at high temperature. These devices are becoming crucial to success in ESD product testing of CMOS integrated circuits.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; leakage currents; overvoltage protection; power supply circuits; protection; reference circuits; CMOS integrated circuits; IC power supply protection; biased transistor chains; clamp circuits; floating n-wells; p-substrate CMOS; power supply ESD clamps; power supply overvoltages; terminated p-n-p transistor chains; CMOS integrated circuits; Circuit testing; Clamps; Electrostatic discharge; Integrated circuit testing; Power supplies; Protection; Surges; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
  • Conference_Location
    Phoenix, AZ, USA
  • Print_ISBN
    1-878303-59-7
  • Type

    conf

  • DOI
    10.1109/EOSESD.1995.478262
  • Filename
    478262