Title :
Parameter estimation of moving target based on linearly constrained space-time adaptive monopulse technique
Author :
Wu, Renbiao ; Wang, Lu ; Su, Zhigang ; Huang, Jingxiong
Author_Institution :
Tianjin Key Lab. for Adv. Signal Process., Civil Aviation Univ. of China, Tianjin, China
Abstract :
Technique of space-time adaptive processing (STAP), which is usually employed by airborne radar to reject the ground clutter and jamming and at the same time, detect the ground moving targets, can not estimate the spatial-temporal parameters of the corresponding targets. Monopulse technique, as a mature method for parameter estimation can be used on airborne radar, however, the estimation performance of this method is dramatically effected by the ground clutter and jamming components present, even when these components falls into the mainbeam interval. By combining the STAP technique with the monopulse technique, a new method for estimating the spatial-temporal parameters of moving targets is proposed and referred as to LC-STAM in this paper. Additionally, the proposed method utilizes the beam null, monopulse slope, and decoupling constraints to remove the worse influence on the beam shape from the mainbeam clutter, maintain the characteristic of the monopulse ratio, and increase the veracity of parameter estimation. Simulation results illustrated that the LC-STAM method possesses the excellent estimation performance of the spatail-temporal parameters by comparing with the other similar methods.
Keywords :
object detection; parameter estimation; space-time adaptive processing; airborne radar; beam null; decoupling constraint; excellent estimation performance; ground clutter; ground moving target detection; jamming; linearly constrained space-time adaptive monopulse; monopulse ratio; monopulse slope; parameter estimation; space-time adaptive processing; spatial-temporal parameter; Airborne radar; Arrays; Clutter; Estimation; Jamming; Parameter estimation;
Conference_Titel :
Phased Array Systems and Technology (ARRAY), 2010 IEEE International Symposium on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4244-5127-2
Electronic_ISBN :
978-1-4244-5128-9
DOI :
10.1109/ARRAY.2010.5613386