Title :
Creating modular test systems
Author :
Wilhite, Bruce ; Craig, Donald
Author_Institution :
Lockheed Martin
Abstract :
Paper not available at time of Publication
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613559