DocumentCode :
2725159
Title :
Improved speed and accuracy of automated measurements through lower noise signal analysis platforms
Author :
Hansen, John S. ; Zarlingo, B.
Author_Institution :
Applic. Eng., Agilent Technol., Inc., Santa Rosa, CA, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Spectrum measurements are essential to RF and microwave testing, and newer analyzers deliver better performance and speed. New “signal analyzers” also add vector capabilities such as precision demodulation and time domain analysis plus wideband waveform capture and playback. With built-in measurement applications the analyzers can streamline systems by making phase noise and noise figure measurements, plus full pulse analysis. In many cases their performance is high enough to replace power meters and modulation analyzers. This paper will show how to make the most of signal analyzers; how to optimize measurement quality and efficiency, how to take advantage of all the analyzer inputs and outputs and the wide array of automatic functions. It will detail how to use the higher dynamic range and lower noise floor of a high performance signal analyzer to greatly improve measurement accuracy and speed leading to improved system readiness.
Keywords :
automatic testing; microwave measurement; signal processing equipment; spectral analysers; RF testing; automated measurement; microwave testing; noise signal analysis platform; signal analyzer; spectrum measurements; Accuracy; Digital filters; Floors; Noise; Noise measurement; Power measurement; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613565
Filename :
5613565
Link To Document :
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