• DocumentCode
    2726293
  • Title

    What can we do to stay current with technology?

  • Author

    Kirkland, Larry V.

  • Author_Institution
    WesTest Eng., Farmington, UT, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits we need to think outside the box when if comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.
  • Keywords
    aerospace testing; fault diagnosis; integrated circuit testing; integrated circuits; diagnostics; microcircuit; prognostic; repair cycle; test cycle; Hardware; Humans; Instruments; Robustness; Sensors; Software; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613628
  • Filename
    5613628
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2726293