DocumentCode
2729319
Title
The Bulk Built In Current Sensor Approach for Single Event Transient Detection
Author
Wirth, Gilson ; Fayomi, Christian
Author_Institution
Univ. Fed. do Rio Grande do Sul, Porto Alegre
fYear
2007
fDate
20-21 Nov. 2007
Firstpage
1
Lastpage
4
Abstract
Radiation effects, particularly single event transients (SETs), are increasingly affecting the reliability of integrated circuits as device dimensions are scaling down. This paper presents the use of bulk built in current sensors (Bulk-BICS) for SET detection. The efficiency and applicability of the bulk-BICS approach for Single Event Transient detection is demonstrated through device and circuit level simulations.
Keywords
electric sensing devices; integrated circuit reliability; radiation effects; transients; bulk built; circuit level simulation; current sensor approach; integrated circuit reliability; radiation effect; single event transient detection; Circuit faults; Circuit simulation; Event detection; Fault detection; Integrated circuit reliability; Logic; Monitoring; Radiation effects; Semiconductor device reliability; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
System-on-Chip, 2007 International Symposium on
Conference_Location
Tampere
ISSN
07EX1846C
Print_ISBN
978-1-4244-1368-3
Electronic_ISBN
07EX1846C
Type
conf
DOI
10.1109/ISSOC.2007.4427422
Filename
4427422
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