Title :
Low-impedance evaluation of power distribution network for decoupling capacitor embedded interposers of 3-D integrated LSI system
Author :
Kikuchi, Katsuya ; Ueda, Chihiro ; Takemura, Koichi ; Shimada, Osamu ; Gomyo, Toshio ; Takeuchi, Yukiharu ; Ookubo, Toshikazu ; Baba, Kazuhiro ; Aoyagi, Masahiro ; Sudo, Toshio ; Otsuka, Kanji
Author_Institution :
NeRI, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
Abstract :
We evaluated low-impedance power distribution network (PDN) of decoupling capacitor embedded interposers for 3-D integrated LSI system. Measurements are carried out using the developed impedance analyzer system of a wide frequency range for evaluating ultralow impedance, and calculations are carried out using 2.5-D finite element method (FEM) electromagnetic field simulator. We fabricated various types of capacitor mounted or capacitor embedded interposers test element group (TEG), such as surface-mounted and embedded chip capacitors, and thin film capacitors on silicon interposers using the same simple design to compare measurement results with calculation ones. As a result, the chip capacitor embedded organic interposer TEG and thin film capacitor embedded silicon interposer TEG could provide low PDN impedance at a wide frequency range of up to 40 GHz. In particular, the interposer TEGs of the thin film capacitor embedded interposer that shows a low impedance of 0.1 Ω could be evaluated and calculated accurately. By using chip capacitor embedded or thin film capacitor embedded interposers for 3-D integrated LSI system, it is expected that the PDN of the system can be achieved ultralow PDN impedance.
Keywords :
Capacitors; Electromagnetic measurements; Frequency; Impedance measurement; Large scale integration; Power systems; Semiconductor thin films; Silicon; Surface impedance; Transistors;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490807