Fault simulation of built-in tester for CMOS switched-current circuits

Author

Wang, Jin-Sheng ; Huang, Wei-Hsing ; Wey, Chin-Long

Author_Institution

Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA

fYear

1998

fDate

9-12 Aug 1998

Firstpage

212

Lastpage

215

Abstract

This paper presents a built-in tester that enhances the testability of CMOS switched-current circuits and simplifies their test generation process. The tester is comprised of a high accuracy current comparator, a voltage winder comparator, and a digital latch. In this study, a high accuracy current comparator which is capable of autozeroing and self-testing is developed. The autozeroing property increases the accuracy of the tester. This paper demonstrates the self-testability of the tester through a fault simulation

Keywords

CMOS integrated circuits; built-in self test; comparators (circuits); fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; switched current circuits; CMOS switched-current circuits; autozeroing; built-in tester; current comparator; digital latch; fault simulation; self-testability; self-testing; test generation process; testability; voltage winder comparator; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit interconnections; Switched capacitor circuits; Switching circuits; Switching converters; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1998. Proceedings. 1998 Midwest Symposium on

Conference_Location

Notre Dame, IN

Print_ISBN

0-8186-8914-5

Type

conf

DOI

10.1109/MWSCAS.1998.759471

Filename

759471