Title :
The Malfunction and Immunity limit of Information technology equipment under HPEM environments
Author :
Sekiguchi, Hidenori ; Seto, Shinji ; Minematsu, Ikuya
Author_Institution :
Security Fundamentals Group, Nat. Inst. of Inf. & Commun. Technol., Koganei
Abstract :
This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.
Keywords :
TEM cells; electromagnetic waves; information technology; local area networks; Ethernet hub; HPEM environments; bulk current injection; immunity limit; information technology equipment; malfunction; transverse electromagnetic cell; Electromagnetic compatibility; Electromagnetic devices; Electromagnetic radiation; Ethernet networks; Immunity testing; Information security; Information technology; Local area networks; Performance analysis; TEM cells;
Conference_Titel :
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location :
Zurich
Print_ISBN :
978-3-9523286-4-4
DOI :
10.1109/EMCZUR.2009.4783392
