Title :
Alternative patterning techniques enabling fine pitch interconnection on topography surfaces
Author :
Iker, F. ; Funaya, T. ; Jamieson, G. ; Beyne, E.
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
We report on the fabrication of small pitch (20 µm) interconnection structures based on Cu pillars embedded in polymer. Such structures are useful in different applications such as integrated passives and die embedding technologies. To allow the fabrication of such structures, we made use of the diamond bit cutting and dry etching techniques as alternatives to the currently used lithographic process. This latter did not allow targeting such aggressive pitches and structures dimensions.
Keywords :
Dielectrics; Dry etching; Lithography; National electric code; Optical device fabrication; Polymers; Rough surfaces; Stacking; Surface roughness; Surface topography;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490935