Dynamic Negative Bias Temperature Instability and Comprehensive Modeling in PMOS Body-Tied FinFETs

This paper presents a novel approach to estimate the rising and falling behavior of N^th-order on-state current by dynamic negative bias temperature instability (DNBTI). For the first time, a modified DNBTI model in PMOS body-tied FinFETs was proposed and compared with experimental data. The approach can provide a quick estimation of periodic DNBTI behavior by stress and recovery. The DNBTI behaviors dependent upon stress bias, fin width, body temperature, and substrate bias were analyzed. The proposed model closely matched with the measured static-lifetime