Title :
Proceedings of the 2005 Biopolar/BiCMOS Circuits and Technology (IEEE Cat. No. 05CH37709)
Abstract :
The following topics are dealt with: wireless communication systems; innovative process technology; BJT reliability physics; statistical and breakdown modeling; power device technology; wireless circuits and building blocks; RF power amplifiers; bipolar/BiCMOS technology integration; analog-digital converters; semiconductor device modeling; high frequency front-end circuits; analog devices; RF devices; RF circuit blocks; advanced SiGe HBT; and RF power.
Keywords :
BiCMOS integrated circuits; analogue-digital conversion; heterojunction bipolar transistors; microwave devices; power amplifiers; power semiconductor devices; radiofrequency integrated circuits; semiconductor device breakdown; semiconductor device models; semiconductor device reliability; BiCMOS technology integration; RF devices; RF power amplifiers; analog devices; analog-digital converters; bipolar junction transistor reliability; bipolar technology integration; breakdown modeling; heterojunction bipolar transistor; high frequency front-end circuits; power device technology; semiconductor device modeling; statistical modeling; wireless circuits; wireless communication systems;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-9309-0
DOI :
10.1109/BIPOL.2005.1555179
