• DocumentCode
    2734026
  • Title

    Including Stripline Connections into Network Parameter Based Via Models for Fast Simulation of Interconnects

  • Author

    Rimolo-Donadio, Renato ; Brüns, Heinz-Dietrich ; Schuster, Christian

  • Author_Institution
    Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg
  • fYear
    2009
  • fDate
    12-16 Jan. 2009
  • Firstpage
    345
  • Lastpage
    348
  • Abstract
    Comprehensive physics-based via models are extended to consider traces connecting vias in PCB and package structures (stripline connection). The traces routed between two power planes are described by modal decomposition to account for the contribution of the parallel plate mode and the stripline mode. The analytical formulation for two vias connected by a trace is provided in this work. It results in a fully parameterized 4-port network, formed by the parallel connection of four 4-by-4 admittance matrices corresponding to: the parallel plate mode, the stripline mode, a coupling factor resulting from the superposition of the two modes, and the capacitances between the via barrel and the power planes. With this novel formulation, good correlation with respect to full-wave simulations could be observed up to 20 GHz, with a remarkable improvement on the computation speed (up to three orders of magnitude).
  • Keywords
    high-speed integrated circuits; integrated circuit interconnections; printed circuits; 4-by-4 admittance matrices; PCB; analytical formulation; comprehensive physics-based via models; interconnects fast simulation; modal decomposition; network parameter; stripline connections; Admittance; Capacitance; Design optimization; Impedance; Integrated circuit interconnections; Joining processes; Packaging; Power system modeling; Stripline; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-3-9523286-4-4
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2009.4783461
  • Filename
    4783461