DocumentCode :
2734089
Title :
Assessment of the Immunity of Unshielded Multi-Core Integrated Circuits to Near-Field Injection
Author :
Alaeldine, Ali ; Ordas, Thomas ; Perdriau, Richard ; Maurine, Philippe ; Ramdani, Mohamed ; Torres, Lionel ; Drissi, M´hamed
Author_Institution :
ESEO - LATTIS, Angers
fYear :
2009
fDate :
12-16 Jan. 2009
Firstpage :
361
Lastpage :
364
Abstract :
This paper presents a comparative assessment of the electromagnetic immunity of 4 integrated logic cores to near-field injection. These cores, located on the same die, are identical from a functional point of view, but differ by their design strategies. The injection is performed above each core according to the 6 components of the electromagnetic field, using appropriate probes. These results demonstrate that the die and bondwires of an integrated circuit can be sensitive to both magnetic and electric fields, and that some design rules can improve the immunity of integrated circuits to near-field interference.
Keywords :
integrated circuit testing; integrated logic circuits; interference; mixed analogue-digital integrated circuits; comparative assessment; electromagnetic field; electromagnetic immunity; integrated logic cores; near field injection; near field interference; unshielded multi core integrated circuits; CMOS technology; Circuit testing; Electromagnetic interference; Integrated circuit measurements; Magnetic field measurement; Packaging; Probes; Protection; Semiconductor device measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location :
Zurich
Print_ISBN :
978-3-9523286-4-4
Type :
conf
DOI :
10.1109/EMCZUR.2009.4783465
Filename :
4783465
Link To Document :
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