• DocumentCode
    2734162
  • Title

    Key Learning from Quanta ICT Low resistance Failure Issue

  • Author

    Pan, Sherry

  • Author_Institution
    Intel Products (Shanghai) Ltd., Shanghai
  • fYear
    2005
  • fDate
    27-29 June 2005
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Quanta reported high failure due to Montara ICT low resistance. The issue is described in details, as well as the solving procedure. Some of the key learning is shared
  • Keywords
    failure analysis; integrated circuit testing; Montara ICT low resistance; Quanta; low resistance failure issue; solving procedure; Circuit testing; Customer satisfaction; Data engineering; Degradation; Electrical resistance measurement; Page description languages; Quality management; Switches; Switching circuits; Trade agreements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9292-2
  • Electronic_ISBN
    0-7803-9293-0
  • Type

    conf

  • DOI
    10.1109/HDP.2005.251375
  • Filename
    4017416
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2734162