• DocumentCode
    2734501
  • Title

    Optimization of lead free solder paste for robust process and reliable solder joint.

  • Author

    Laügt, Anne Marie ; Evers, P.C.J. ; Caban, D. ; Wilczek, P. ; Spilka, G.

  • Author_Institution
    Avantec, Bry sur Marne
  • fYear
    2005
  • fDate
    27-29 June 2005
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper will describe the process of lead free SnAgCu solder paste optimization to fulfil various industrial partners production constraints. A linear thermal profile which is highly recommended by solder paste manufacturers for lead free process cannot be applied to the full range of product. The challenge in IMS EFSOT program is to bring a solution with a robust solder paste formulation suitable for fine pitch printing, safe no clean flux in combination with a large soak zone in the reflow profile. A test vehicle has been designed by Philips, Thomson and AB Mikroelektronik which is representative for consumer applications and automotive applications. It contains a wide range of advanced components, such as: a.o. passives from 0201 to 0603, large heat sink packages, fine pitch BGAs. Further different pad designs and finishes, test patterns, various board materials and sizes are included. Once the printing and reflow performances of the solder paste have been validated with success, quality and reliability of solder joint were tested through visual control, X Ray and thermal cycling
  • Keywords
    adhesives; reflow soldering; reliability; silver compounds; solders; tin compounds; SnAgCu; X Ray; fine pitch printing; lead free solder paste; reflow profile; reliable solder joint; robust process; test vehicle; thermal cycling; thermal profile; visual control; Constraint optimization; Environmentally friendly manufacturing techniques; Lead; Manufacturing industries; Manufacturing processes; Printing; Production; Robustness; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9292-2
  • Electronic_ISBN
    0-7803-9293-0
  • Type

    conf

  • DOI
    10.1109/HDP.2005.251394
  • Filename
    4017435