DocumentCode :
2734542
Title :
n-type silicon - enabling efficiencies > 20% in industrial production
Author :
Glunz, S.W. ; Benick, J. ; Biro, D. ; Bivour, M. ; Hermle, M. ; Pysch, D. ; Rauer, M. ; Reichel, C. ; Richter, A. ; Rüdiger, M. ; Schmiga, C. ; Suwito, D. ; Wolf, A. ; Preu, R.
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst. (ISE), Freiburg, Germany
fYear :
2010
fDate :
20-25 June 2010
Abstract :
In the first part of this paper we estimate the efficiency potential of crystalline silicon solar cells on conventionally pulled p-type boron-doped Czochralski-grown silicon with typical oxygen concentrations. Taking into account an industrial high-efficiency cell structure featuring fine-line metallization, shallow and well-passivated emitter and a rear surface structure with dielectric passivation and local laser-fired point contacts, the maximum achievable efficiency is around 20%. The main limitation of such a cell is due to the rather low bulk lifetime after light-induced degradation. Even when avoiding the metastable boron-oxygen defect by using Gallium-doped or magnetic Cz-silicon, it has to be kept in mind that the detrimental impact of metal contaminations on p-type silicon is greater than on n-type silicon. A potential strategy to reduce this loss is the use of n-type silicon. Therefore, the second part of the paper discusses different architectures for solar cells on n-type silicon substrates and shows the latest results achieved at Fraunhofer ISE in this field.
Keywords :
crystal defects; elemental semiconductors; passivation; silicon; solar cells; Si:B; crystalline silicon solar cells; dielectric passivation; metal contaminations; metallization; p-type silicon solar cells; solar cell industrial production; solar cell manufactures; Computer architecture; Conductivity; Microprocessors; Passivation; Silicon; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5614203
Filename :
5614203
Link To Document :
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