Detecting the Number of EMI Sources Based on Higher Order Statistics

Author

Zhenfei, Song ; Donglin, Su ; Shuguo, Xie

Author_Institution

EMC Lab., Beijing Univ. of Aeronaut. & Astronaut., Beijing

fYear

2009

fDate

12-16 Jan. 2009

Firstpage

465

Lastpage

468

Abstract

A new method for electromagnetic compatibility (EMC) fault diagnosis based on blind source separation (BSS) is proposed in this paper. Higher order statistics (HOS) method is used to detect the number of electromagnetic interference (EMI) sources. Differing from normal analysis, the new method is performed in frequency domain considering the characteristics of EMC problem. Simulation shows better noise immunity of the new method, and the feasibility is verified by using EMI measurement data. This new method provides a new way for EMC fault diagnosis.

Keywords

blind source separation; electromagnetic compatibility; electromagnetic interference; fault diagnosis; frequency-domain analysis; higher order statistics; BSS; EMI sources; blind source separation; electromagnetic compatibility fault diagnosis; frequency domain analysis; higher order statistics; Blind source separation; Electromagnetic compatibility; Electromagnetic interference; Fault diagnosis; Frequency domain analysis; Higher order statistics; Immunity testing; Noise measurement; Performance analysis; Source separation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2009 20th International Zurich Symposium on

Conference_Location

Zurich

Print_ISBN

978-3-9523286-4-4

Type

conf

DOI

10.1109/EMCZUR.2009.4783491

Filename

4783491