Title :
Detecting the Number of EMI Sources Based on Higher Order Statistics
Author :
Zhenfei, Song ; Donglin, Su ; Shuguo, Xie
Author_Institution :
EMC Lab., Beijing Univ. of Aeronaut. & Astronaut., Beijing
Abstract :
A new method for electromagnetic compatibility (EMC) fault diagnosis based on blind source separation (BSS) is proposed in this paper. Higher order statistics (HOS) method is used to detect the number of electromagnetic interference (EMI) sources. Differing from normal analysis, the new method is performed in frequency domain considering the characteristics of EMC problem. Simulation shows better noise immunity of the new method, and the feasibility is verified by using EMI measurement data. This new method provides a new way for EMC fault diagnosis.
Keywords :
blind source separation; electromagnetic compatibility; electromagnetic interference; fault diagnosis; frequency-domain analysis; higher order statistics; BSS; EMI sources; blind source separation; electromagnetic compatibility fault diagnosis; frequency domain analysis; higher order statistics; Blind source separation; Electromagnetic compatibility; Electromagnetic interference; Fault diagnosis; Frequency domain analysis; Higher order statistics; Immunity testing; Noise measurement; Performance analysis; Source separation;
Conference_Titel :
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location :
Zurich
Print_ISBN :
978-3-9523286-4-4
DOI :
10.1109/EMCZUR.2009.4783491
