Title :
Modal analysis of loaded N-port scatterers
Author :
Harrington, R.F. ; Mautz, J.R.
Author_Institution :
Syracuse University, Syracuse, NY, USA
Keywords :
Electromagnetic scattering; Impedance; Modal analysis; Wire;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1972
DOI :
10.1109/APS.1972.1146982
