A parameter identification approach to fault diagnosis of switched capacitor circuits

This paper deals with fault diagnosis of switched capacitor circuits. This problem has not received as much attention as that reported for MOS digital circuits. Analog integrated MOS circuits are increasing in complexity and the testing problem has to be considered as a vital part of the design and production process. This paper considers the application of the parameter identification techniques to the fault diagnosis of switched capacitor circuits. The technique is based on identifying the discrete time transfer function coefficients of the circuit under test from the time-domain response. Then the circuit parameters are identified using an optimization technique