DocumentCode
2739735
Title
Finite element analysis and cryogenic experiment investigation of moving reflector sub-system
Author
Qu, Jinxiang
Author_Institution
Chinese Acad. of Sci., Shanghai
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
328
Lastpage
328
Abstract
Temperature distribution of moving reflector is obtained by finite element analysis. The cryogenic experimental result has shown that the hypothesis and analysis is reasonable.
Keywords
cryogenics; finite element analysis; temperature distribution; cryogenic experiment investigation; finite element analysis; moving reflector subsystem; temperature distribution; Cryogenics; Finite element methods; Image analysis; Infrared imaging; Mirrors; Optical interferometry; Physics; Refrigeration; Temperature; Vacuum systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368536
Filename
4222270
Link To Document