Title :
Synthesis and Properties of Templated Si-based Nanowires for Electrical Transport
Author :
Lee, Jae Ho ; Rogers, Phillip H. ; Carpenter, Michael A. ; Eisenbraun, Eric T. ; Xue, Yongqiang ; Geer, Robert E.
Author_Institution :
Coll. of Nanoscale Sci. & Eng., State Univ. of New York, Albany, NY
Abstract :
Self-assembled Si nanowires (SiNWs) have been synthesized and characterized as a template for surface metal silicide formation to investigate electron transport at the nanowire surface. Silicon nanowires were directly grown on silicon substrates via the solid-liquid-solid (SLS) growth process. Preliminary synthesis utilized high-temperature processing of a sputtered Au catalyst film on Si (100) and (111) substrates in an oxygen-filtered Ar ambient. SiNW diameter was a roughly monotonic function of the growth time/temperature. The diameters of the SiNW templates ranged from approximately 5 nm to 180 nm. Ni deposition on the SLS SiNWs and post-deposition thermal processing was carried out for silicide formation. Metal-silicide coated nanowires were dispensed on metal-patterned Si wafers for electrical characterization and exhibited an improvement in conductivity of several orders of magnitude.
Keywords :
catalysts; electrical conductivity; elemental semiconductors; gold; metallic thin films; nanotechnology; nanowires; nickel compounds; self-assembly; semiconductor growth; semiconductor quantum wires; silicon; surface conductivity; Au-Si; Ni-Si; NiSi; Si; conductivity; high-temperature processing; metal-patterned wafers; monotonic function; post-deposition thermal processing; silicon substrates; solid-liquid-solid growth; sputtered catalyst; surface electrical transport; surface metal silicide; templated self-assembled nanowires; Electrons; Gold; Laser sintering; Nanowires; Rough surfaces; Self-assembly; Silicides; Silicon; Substrates; Surface roughness;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.173