DocumentCode
2740271
Title
Improving Boolean Circuit Testing by using Quantum Search
Author
Chou, Yao-Hsin ; Kuo, Sy-Yen
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
617
Lastpage
620
Abstract
Given any classical circuit, a minimum input quantum version of boolean circuit can be constructed with general CCN gates. Any quantum boolean circuit can be easily tested with one test pattern under stuck-at fault model. In this paper, we apply quantum search algorithm to boolean logic testing problem and drastically decrease not only the number of test patterns but also the time and the number of bits we needed to find out the faulty wires.
Keywords
fault diagnosis; logic testing; quantum gates; CCN gates; boolean logic testing; classical circuit; faulty wires; input quantum version; quantum boolean circuit testing; quantum search algorithm; stuck-at fault model; Boolean functions; Circuit faults; Circuit testing; Contacts; Integrated circuit interconnections; Logic arrays; Logic circuits; Logic testing; Parallel processing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.185
Filename
4617167
Link To Document