Observation on the attachment processes of competition tests under switching impulse voltage

The attachment processes of competition tests under switching impulse voltage were studied in this paper. A series of competition tests with rod-rod gap configuration for these studies were carried out. In these competition tests, a high-speed CCD video camera was used to clarify the attachment processes, assisting by current measurement of the grounded rods and the voltage measurement of the discharge gap. The experimental results indicated that the processes can be divided into two stages related to the downward discharge and the upward discharge respectively, both in positive and negative competition tests. However, the scale of the two stages and the discharge process in the two stages are different, and these differences affect the striking probability finally.