• DocumentCode
    2741095
  • Title

    SiO2 as barrier layer for Na out-diffusion from soda-lime glass

  • Author

    Yan, Yanfa ; Li, Xiaonan ; Dhere, Ramesh ; Al-Jassim, Mowafak ; Jones, Kim ; Young, Matt ; Scott, Marty

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    To reduce the manufacturing cost, soda-lime glass (SLG) is often used as the substrate for thin-film solar cells. It is known that SLG contains about 16 wt% Na in the form of Na2O. During the growth of thin films, Na ions may diffuse out from SLG and diffuse into the grown thin films and affect the optoelectronic properties of the thin films. The widely used commercial F-doped Sn2O (FTO) glass (Teck 15) has the structure SLG/FTO/SiO2/FTO. The first FTO layer and the SiO2 layer are very thin. The SiO2 layer is often expected to be a barrier layer for Na out-diffusion from SLG. However, our transmission electron microscopy (TEM) study indicates that there is a significant amount of Na existing in the second FTO layer, further indicating that SiO2 may not be a good barrier layer for Na out-diffusion. Therefore, we have investigated the possibility of a SiO2 layer as a barrier layer for Na out-diffusion from SLG. We have deposited two types of samples, SLG/SiO2/FTO and SLG/FTO, at 550°C. For comparison, these samples were also annealed at temperatures between 550° and 650°C. The as-deposited and annealed samples were examined by TEM, X-ray energy dispersive spectroscopy (EDS) and secondary-ion mass spectrometry (SIMS). We found that SiO2 is indeed an effective barrier layer for Na out-diffusion. Thermal annealing can enhance Na diffusion. It should be pointed out that our deposited SiO2 layer may behave differently from the SiO2 layer seen in the commercial FTO-coated glass.
  • Keywords
    optoelectronic devices; secondary ion mass spectroscopy; silicon compounds; sodium; solar cells; thin film devices; SiO2; X-ray energy dispersive spectroscopy; effective barrier layer; optoelectronic property; secondary ion mass spectrometry; soda lime glass; thin film solar cell; transmission electron microscopy; Annealing; Electron beams; Glass; Ions; Photovoltaic cells; Spectroscopy; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614657
  • Filename
    5614657