DocumentCode :
2741735
Title :
THz near-field microscopy - A review
Author :
Lin, Hungyen ; Fischer, Bemd M. ; Mickan, Samuel P. ; Abbott, Derek
Author_Institution :
Univ. of Adelaide, Adelaide
fYear :
2006
fDate :
18-22 Sept. 2006
Firstpage :
441
Lastpage :
441
Abstract :
One of the major limitations of THz imaging is low spatial resolution. Consequently, various techniques have been proposed in the literature to break the diffraction limit. Many of the existing techniques draw inspiration from near-field scanning optical microscopy, while other techniques tightly focus optical beams to reduce the size of the generated THz beams. This paper reviews briefly the existing THz near-field methods and recent developments for identifying possible areas of research potential.
Keywords :
image resolution; near-field scanning optical microscopy; reviews; submillimetre wave imaging; THz imaging; THz near-field microscopy; near-field scanning optical microscopy; review; spatial resolution; Apertures; Focusing; Image resolution; Microscopy; Optical beams; Optical imaging; Optical pumping; Physics; Probes; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
Type :
conf
DOI :
10.1109/ICIMW.2006.368649
Filename :
4222383
Link To Document :
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