• DocumentCode
    2742445
  • Title

    Using a CISC microcontroller to test embedded memories

  • Author

    van de Goor, Ad ; Hamdioui, Said ; Gaydadjiev, Georgi

  • Author_Institution
    ComTex, Gouda, Netherlands
  • fYear
    2010
  • fDate
    14-16 April 2010
  • Firstpage
    261
  • Lastpage
    266
  • Abstract
    Small microcontroller-based systems are omnipresent. Often, they do not have Memory BIST (MBIST), or the MBIST is not available to the user. In such cases the CPU will be the only resource to perform at least the Power-On testing of the embedded memories. This paper highlights the capabilities and limitations of CISC architectures to apply at-speed memory tests.
  • Keywords
    Algorithms; Assembly; Built-in self-test; Embedded computing; Microcontrollers; Performance evaluation; Power engineering and energy; Power engineering computing; Registers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
  • Conference_Location
    Vienna, Austria
  • Print_ISBN
    978-1-4244-6612-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2010.5491773
  • Filename
    5491773
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2742445