A 576k 3.5-ns access BiCMOS ECL static ram with array built-in self test
Author :
Bonges, H.A. ; Adams, D. ; Allen, A. ; Flaker, R. ; Frederick, T. ; Gilbert, L. ; Gray, K. ; Hedberg, E. ; Holman, T. ; Lattimore, G. ; Lavalette, D. ; K.Nguyen ; Roberts, A.
Author_Institution :
IBM General Technology Division
fYear :
1991
fDate :
May 30 1991-June 1 1991
Firstpage :
13
Lastpage :
14
Keywords :
Automatic testing; BiCMOS integrated circuits; CMOS technology; Decoding; Driver circuits; Logic testing; Random access memory; Resistors; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on
