DocumentCode :
2742876
Title :
Word-line Architecture For Constant Reliability 64Mb DRAM
Author :
Takashima, D. ; Oowaki, Y. ; Ogiwara, R. ; Watanabe, Y. ; Tsuchida, K. ; Ohta, M. ; Nakano, H. ; Watanabe, S. ; Ohuchi, K.
Author_Institution :
Toshiba Corporation
fYear :
1991
fDate :
May 30 1991-June 1 1991
Firstpage :
57
Lastpage :
58
Keywords :
Circuits; Degradation; Dielectrics; Fluctuations; Intrusion detection; Random access memory; Stress; Temperature; Ultra large scale integration; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on
Conference_Location :
Oiso, Japan
Type :
conf
DOI :
10.1109/VLSIC.1991.760076
Filename :
760076
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2742876
