DocumentCode
2742876
Title
Word-line Architecture For Constant Reliability 64Mb DRAM
Author
Takashima, D. ; Oowaki, Y. ; Ogiwara, R. ; Watanabe, Y. ; Tsuchida, K. ; Ohta, M. ; Nakano, H. ; Watanabe, S. ; Ohuchi, K.
Author_Institution
Toshiba Corporation
fYear
1991
fDate
May 30 1991-June 1 1991
Firstpage
57
Lastpage
58
Keywords
Circuits; Degradation; Dielectrics; Fluctuations; Intrusion detection; Random access memory; Stress; Temperature; Ultra large scale integration; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on
Conference_Location
Oiso, Japan
Type
conf
DOI
10.1109/VLSIC.1991.760076
Filename
760076
Link To Document