DocumentCode :
2743484
Title :
Nano-scale Metamaterials: Fabrication and Optical Measurements from THz towards visible
Author :
Hao, Zhao ; Martin, Michael C. ; Harteneck, Bruce ; Liddle, Alex
Author_Institution :
Lawrence Berkeley Nat. Lab., Berkeley
fYear :
2006
fDate :
18-22 Sept. 2006
Firstpage :
541
Lastpage :
541
Abstract :
We have designed, fabricated, and optically measured several different nano-scale metamaterials. We employ e-beam nano-lithography technology at LBNL´s CXRO for fabricating these structures on extremely thin SiN substrates so that they are close to free-standing. Optical properties were measured as a function of incidence angle and polarization using the ALS synchrotron IR beamlines. We directly observe strong magnetic resonances consistent with negative magnetic permeability in our samples at THz through near-IR optical frequencies. We will compare the results to detailed simulations. Finally, we will report on our progress towards constructing a negative index of refraction nano-scale metamaterial.
Keywords :
metamaterials; nanolithography; optical design techniques; optical fabrication; optical testing; photolithography; IR optical frequency; e-beam nanolithography technology; incidence angle; magnetic resonances; nanoscale metamaterials; negative magnetic permeability; optical measurements; polarization; Magnetic materials; Magnetic resonance; Metamaterials; Optical design; Optical device fabrication; Optical polarization; Optical refraction; Silicon compounds; Synchrotrons; Ultraviolet sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
Type :
conf
DOI :
10.1109/ICIMW.2006.368749
Filename :
4222483
Link To Document :
بازگشت