DocumentCode
2743643
Title
A look at the sensitivity of the Thru-Reflect-Line vector network analyzer calibration algorithm
Author
Eiø, Christopher
Author_Institution
Nat. Phys. Lab., Teddington, UK
fYear
2012
fDate
1-6 July 2012
Firstpage
24
Lastpage
25
Abstract
This paper looks at the sensitivity of the Thru-Reflect-Line and Line-Reflect-Line vector network analyzer calibration algorithms to changes in their inputs. Using a consistent measurement data set throughout, it highlights differences observed in the error-corrected measurements of a DUT when interchanging line standards and the effect of small changes to the value of the length of these lines.
Keywords
calibration; error correction; measurement errors; measurement standards; network analysers; DUT; TRL; VNA; calibration algorithm; error corrected measurement; line-reflect-line; measurement standard; thru-reflect-line; vector network analyzer; Calibration; Length measurement; Measurement uncertainty; Sensitivity; Standards; Uncertainty; Vectors; Calibration; microwave frequency; radio frequency; sensitivity; vector network analyzer;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location
Washington, DC
ISSN
0589-1485
Print_ISBN
978-1-4673-0439-9
Type
conf
DOI
10.1109/CPEM.2012.6250640
Filename
6250640
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